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Drop Test Machine
Guangdong ALI Testing Equipment Co,. Ltd
Drop Test Machine -drop tester Satisfy With ASTM , ISTA Industrial Standards,Drop height: up to 2000mm (adjustable).
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Vehicle Test Chambers
Our dynamometer chambers feature dependable mechanical refrigeration, superior air flow, and expansive control systems. Our dynamometer drive-in vehicle test chambers are designed to integrate directly with a dynamometer system, while simultaneously exposing vehicles to a wide variety of environmental conditions including temperature and/or humidity, rain, wind, and more. Our control systems allow for precise temperature and humidity testing while meeting your exact specifications.
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Neonatal Test Equipment
Our lineup of neonatal test equipment is a complete NICU quality assurance solution to ensure infant safety.
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Axle Damping Test
MSD 3000 | VP 215033
Maschinenbau Haldenwang GmbH & Co. KG.
The axle damping test stand MSD 3000 is characterized by a quick and precise physical check of the axle damping. The frequency-controlled plate excitation by means of electric motors determines the maximum oscillation amplitude and then evaluates the axle damping according to the principle of Lehr's damping. The fully automatic test sequence including the determination of the axle and vehicle weight enables a time-saving and reliable assessment of the axle damping.
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Vacuum Switch Tester
Weshine Electric Manufacturing Co., Ltd
1. The instrument has an automatic measurement function.2. The instrument has a perfect back-EMF protection function.3. The instrument uses a 5-inch 65K color LCD touch screen, which is easy to operate.
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Test Container
MTL 15 | VP 700006
Maschinenbau Haldenwang GmbH & Co. KG.
The MTL 15 test container works completely independently thanks to the optionally available, fully integrated power generator. Equipped with a hydraulic set-down device including cable remote control, the test system can be set up within 15 minutes and is therefore ideal for changing locations.
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Digital Functional Test
CTS100i
Capable of performance testing to defined traceable standards, CTS100i is designed to test Military, Aerospace and Safety-Critical equipment. CTS100i is a cost-effective digital functional test system, available in single, dual and three bay versions.
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Chip Test Adapter
RAMCHECK Sync
The RAMCHECK Sync Chip Adapter tests popular TSOP SDRAM memory chips in sizes of 16Mx16, 4Mx16, 32Mx8, 8Mx8, 64Mx4, 16Mx4 and more. Picture above shows the adapter with all optional sockets for 54, 50 and 44-pin.
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Airbag Test System
Dongguan City Simplewell Technology Co. Ltd.
Airbag Test System by Simplewell
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RF Shielded Test Enclosure, I/O Intensive Device Tests
JRE 1720
Like its other brothers in the JRE test line, it features rugged welded aluminum construction with superb RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble-free operation over its lifespan. A JRE exclusive, our triple door locking mechanism allows easy single handle door operation. Ventilation is standard with our JRE exclusive honeycomb style vents in enclosure rear and door.
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10 Gigabit Ethernet Switch
VPX3-687
Curtiss-Wright Defense Solutions
The VPX3-687 is a versatile and high-performance Ethernet switch designed to connect the next generation of 3U systems. Offering performance without compromises, the VPX3-687 provides switching throughput of up to 320 Gbps and full line-rate forwarding of up to 32 x 10 GbE or 8 x 40 GbE interfaces.
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Burn-In Test
Trio-Tech provides a comprehensive range of semiconductor testing services through its state-of-the-art laboratories in the Far East. The laboratories provides static and dynamic Burn-in /HTOL /SLT testing and other testing services. All of the company’s testing facilities are ISO9001, ISO14000, ISO17025 and DSCC certified ensuring that operating policies and procedures meet stringent international standards for consistency and reliability.
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Shielded Test Cell
With an operating frequency starting at 10kHz, the Standard Test Cell (STC) creates an ideal environment for testing wireless devices for such technologies as GSM, UMTS, CDMA, Bluetooth, DECT, etc. Developed for the R&D, production and quality control environments where space is critical.
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Function Test Module
FX Series
Each FX module is specified one which is suitable for 5 inches bay.You can operate each module on the specified software in PC. It is used USB connection between modules and PC.You can connect MAX 16 modules which include digital IO module,relay module and so on.In case you want to use function inspection system which are combined with several modules, it will implement by our environment generation software(FX-Builder) easily.It is possible to implement by your own software as each module is compatible for Active(X).（Notes）ActiveX is compatible for latest Windows 7 32bit.
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Switch Mainframe
SW1001
Switch between voltmeter and battery tester while testing. 66 channels max. (2-wire) to 18 channels max. (4-terminal pair). Circuit design friendly for impedance measurements that minimize errors between channels (Effect: 0.01% f.s.*). For BT4560 100 mΩ range, R measurements, and a measurement frequency of 1 kHz. For OCV measurement, internal resistance measurement, and external potential measurement of battery cells. Measure battery modules up to 60 V DC.
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PXI/PXIe 1000Base-T1 Fault Insertion Switch, 6-Channel
42-203-002
The 40-203-002 (PXI) and 42-203-002 (PXIe) are designed to simulate common faults on high-speed two wire communication interfaces such as 1000Base-T1. They support 6 channels of two wire serial interfaces. Each channel pair can simulate an open fault in either or both wires, and using the fault bus switches can simulate short between both wires or a short to one of two externally applied fault connections – such as battery supply or ground - via two fault buses.
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Test Equipment
Digital Clamp Meter
Is a large AC current digital multi clamp meter, integrated with 2000 Count, True RMS, auto and manual measurement, air-cored coil sensing technology.
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Thermal Test Chip
Thermal Engineering Associates, Inc.
Thermal Test Chips (TTC) are used in many different Applications: Package Thermal Characterization, Heat Source Simulator, Temperature Reference Platform, Transient Analysis, System Thermal Management Design, Thermal Interface Material (TIM) Measurement & Characterization, Heat Sink Measurement & Characterization.
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Test Equipment
ST9020
Shenzhen Star Instrument Co., Ltd.
The ST9020 single-phase energy meter test equipment is full-featured and stable. Optional accuracy classes are 0.1 and 0.05. As divided by structure there are combined type, integrated type and auto wiring type. The meter test equipment is controlled via PC-based software. Choices of meter position are 6, 12, 24, 30, 48 and 60.
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Flying Probe Test
Producing the highest quality test programs since 2005, Test Coach is the proven specialist firm for flying probe test. Our in depth knowledge of SPEA systems and over 10 years of honed flying probe test techniques guarantees that our test programs offer the highest test coverage possible. As an In – Concert Partner with SPEA, we work closely with their team to keep at the forefront of new product innovations and technology, so that we can provide the latest advancements to our customers. In add...show more -
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UDP Test Tool, Flood Generator, VoIP Readiness Test Tool
The Multiprotocol Network Tester is a freeware, open source tool which enables you to measure quality of your IP network. It can also be used to generate UDP flood or to simulate UDP DoS attack. SIP call is usually established using a SIP session with a bidirectional RTP stream. SIP and RTP protocols are based on UDP transport protocol. UDP uses a simple transmission model without implicit reliability, ordering and data integrity. Each single UDP packet is transferred independently. The quality of a SIP call depends on delays and loss of IP packets in a network. Long delays lead to large RTP jitter and bad sound quality of a SIP call.
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Burn-in and Test Sockets
Loranger International Corporation
Loranger International Corporation designs and manufactures thousands of socket styles for the burn-in and test of semiconductors and electronic components. Some of the socket styles are listed below.
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Multi-Cell Test System
Cellcia
Next-generation wafer probing system for 300mm wafers. The multi-layer system structure maximizes the efficiency of testing, further reducing the total testing cost.
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Relay Switch For Medium- To High-Power DC Loads
S20DC100
Series S20 relays switch medium- to high-power DC loads. These devices feature the latest-generation MOSFET technology as well as an innovative isolated driver to ensure fast power turn on and off. The relays feature triggered control input to avoid linear control risks and fast switching times. The relays also offer an LED for status.
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Automated Test System
Automated Test System is a production-ready solution that combines test software and various hardware for validation test in both manufacturing and R&D. The solution provides a high performance and cost-effective system based on National Instruments technology.
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Test Handler
M6242
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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6U Switch Board - PICMG2.16 Specification
CP68301
LinkedHope Intelligent Technologies Co.,Ltd.
CP68301 meets PICMG2.16 specifications, mainly used for high speed data exchange between the board and the routing to the internal CPCI, ATR case. The CPCI structure of the module uses the standard 6U, and can be compatible with the ATR structure design. Heat dissipating performance and unique environmental protection design of anti - vibration design, reliable and excellent. The module integrates switching and routing functions, with 24 10/100/1000M adaptive Ethernet interface, satisfy the chassis and external data transmission, realize the comprehensive integrated, modular, easy maintenance use, improve equipment reliability and application.
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Broadband Network Test
Whether testing via Voice Switch, DSLAM, OLT or external access device, Enghouse LoopCare comprehensively manages testing in mixed technology networks.
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High Power Switch and Bias Module
Macom Technology Solutions Holdings Inc.
MACOM’s High-Power Switch and Bias modules are extensively used in 4G and 5G TDD base stations as well as aerospace and defense applications. The PIN Diode Switch features high power handling, low insertion loss, and super board band performance. The integrated bias controller utilizes a boost circuit and provide the driver circuitry to the switch. The modules require only a single 5 V supply, and a single TX / RX control signal which greatly reduced the customer design complexity.
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VG Test Panel
TA-300
This panel has many additional features that also allow testing of the VG-206 series gyros. Dedicated API connectors are provided for both pitch and roll outputs. This Panel includes a TA-900 API. This panel is designed to allow by the book testing.
